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DOI Prefix: 10.47001/IRJIET
Vol 6 No 10 (2022): Volume 6, Issue 10, October 2022 | Pages: 32-40
International Research Journal of Innovations in Engineering and Technology
OPEN ACCESS | Research Article | Published Date: 22-10-2022
Defects in the Absorber Layer and other layers of the interlayer in Cadmium Telluride (CdTe) cells are detrimental to their efficiency and stability, the present work will focus on investigating the effect of these defects on their electrical properties (I-V), this work was chosen to simulate solar cells using SCAPS-ID program. The solar cell consisted of Cadmium Telluride (CdTe) as an Absorber layer with a thickness of 0.25µm and a Windows layer (CdS:O) with a thickness of 0.025µm and Buffer Layer (Zn2SnO4) with a thickness of 0.05µm a Transparent Conduction Oxide (FTO) Layer with a thickness of 0.1µm and a Back Reflection layer (Cu2Te) with a thickness of 0.1µm. The best results obtained were:{Voc=0.85V, Jsc=38.07 mA/cm2, FF=86.37%, h=28.07%}, the results showed that when the defect density of the Absorbent Layer varied from (1×109cm-3) to (1×1018 cm-3) while keeping the other cell parameters unchanged, as well as the defect density for the rest of the layers of the solar cell it was observed that cell parameters were significantly reduced at high defect densities. Also, the defect intensity was changed in each of the Window Layer and the Back Reflection Layer separately, while keeping the rest of the parameters in the other layers the same. The density of defects in the interlayer was also changed while fixing the rest of the parameters, and the results were similar to what we obtained in the Absorption Layer, where with high concentrations of defects the cell parameters decrease significantly.
SCAPS-1D; CdTe solar cells; Defect Density in Solar Cell; (C-V) curve
Awadh K. Mahmood, Raad A. Rassol, “Effect of Defect Density in Solar Cell Cu2Te/CdTe/CdS:O/Zn2SnO4/FTO on Electrical Properties (I-V) Using SCAPS-1D Program” Published in International Research Journal of Innovations in Engineering and Technology - IRJIET, Volume 6, Issue 10, pp 32-40, October 2022. Article DOI https://doi.org/10.47001/IRJIET/2022.610006
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