This study was carried out to investigate the genetic consequences of exposing the seeds of fluted pumpkin (Telfairia occidentalis Hook F.) to x-ray doses. The seeds were exposed to varying doses of x-ray irradiation before planting and experiment was set up in a randomized complete block design (RCBD) with five replications. M1 and M2 generations were raised, fresh fluted pumpkin leaves of both generations were subjected to molecular assessment. Data collated were further examined using phylogenetic analysis. Several kinds of SNP mutation in the form of indels and nucleotide substitutions were observed. A total of 17 indels were recorded and at different positions. One substitution was recorded. Both transversion and transition occurred in this study and were in the ratio 4:1 except for G: T transversion and A: G transition at positions 495 and 87 respectively which both had a ratio of 1:1. A total of 7 transversions and 4 transitions were recorded. The highest number of SNP’s mutation frequency was recorded on the M1 and M2 generation seeds exposed to 14.08mGy (4 and 8). This was followed with the M1 and M2 generation seeds exposed to 6.75mGy and 18.75mGy. The least number of point mutations (frequency) was recorded in the unexposed seeds in both generations followed by 10.08mGy exposures of both generations. The phylogenetic analysis revealed the formation of two major Claude from the phylogenetic clusters. These alterations in the DNA arrangement of the fluted pumpkin seeds indicate the effectiveness of x-ray as a mutagenic substance.