Face Detection Attendance Marking Using AI: A Deep Learning Approach for Classroom Environment

Kirthana PraveenDepartment of Computer Science and Business Systems, Rajagiri School of Engineering and Technology, Kerala, IndiaHena K RahmanDepartment of Computer Science and Business Systems, Rajagiri School of Engineering and Technology, Kerala, IndiaD NandakumarDepartment of Computer Science and Business Systems, Rajagiri School of Engineering and Technology, Kerala, IndiaShervin SDepartment of Computer Science and Business Systems, Rajagiri School of Engineering and Technology, Kerala, IndiaMs. Jyotsna. ADepartment of Computer Science and Business Systems, Rajagiri School of Engineering and Technology, Kerala, India

Vol 9 No 1 (2025): Volume 9, Issue 1, January 2025 | Pages: 11-16

International Research Journal of Innovations in Engineering and Technology

OPEN ACCESS | Research Article | Published Date: 06-01-2025

doi Logo doi.org/10.47001/IRJIET/2025.901002

Abstract

This paper presents an automated attendance mark- ing system specifically designed for a classroom environment utilizing deep learning techniques. The system employs a collection of Convolutional Neural Networks (CNN), ResNet, and Histogram of Oriented Gradients (HOG) for accurate face detection and recognition. By implementing a webcam-based face detection with AI capabilities, the system automatically identifies students and marks attendance, storing data in a secure Excel- based database accessible through different user interfaces for administrators and students. The implementation demonstrates significant advantages over traditional methods, particularly in handling varying light conditions and partial face obstruction, while maintaining high accuracy in attendance records. This solution includes a web-based interface for fast access and management of attendance data in a structured format.

Keywords

Face Detection, Deep Learning, CNN, ResNet, HOG, Attendance System, Computer Vision


Citation of this Article

Kirthana Praveen, Hena K Rahman, D Nandakumar, Shervin S, & Ms. Jyotsna. A. (2025). Face Detection Attendance Marking Using AI: A Deep Learning Approach for Classroom Environment. International Research Journal of Innovations in Engineering and Technology - IRJIET, 9(1), 11-16. Article DOI https://doi.org/10.47001/IRJIET/2025.901002

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